Position:Home > Industry Solutions >
Plastic film

EVA/POE Solar Encapsulation Film Thickness Uniformity Measurement

Measurement Soluti

54620e8e-6323-4311-9c70-a15667683b9f.png

Application: Online thickness/basis weight uniformity measurement for solar encapsulation EVA films.

Solution: X-ray online thickness gauge.

Measurement Modes: Scanning, fixed-point, and cyclic fixed-point measurement.

Measurement Range: 10–1000 g/m² (10–1000 μm).Repeatability: ±0.05 g/m² or ±0.05 μm.

Functional Modules:Real-time monitoring & quality data display、Multi-limit quality control (threshold-based alerts/alarms)、Full-data storage & traceability、Historical curve replay、Automated SPC (Statistical Process Control) analysis、Auto-generated quality inspection reports

Additional Applications:

Thickness/basis weight uniformity measurement for EVA, POE, PO, TPU, PA, PES, and other thermoplastic films.

Areal density uniformity measurement for cast/blown plastic films and uniaxially/biaxially stretched plastic films.

Client Case:

3M | Installation Date: March 2018 | Quantity: 2 units (Model RXG2150) | Measurement Width: 2150 mm


Installation Site


2.png

1.png

3.png

4.png


Material Specifications


PropertyTest MethodUnitsTypical Value
ThicknessASTM F2251mmEVA9100EVA9110TEVA9120BEVA9210TEVA9220B
VA-%0.4 - 0.80.4 - 0.80.4 - 0.80.4 - 0.80.4 - 0.8



28~3326~3326~3326~3326~33


3M POE MVTRg/m²/24hPropertyTest MethodUnitsTypical ValueProperty
Test ConditionPO8110PO8510EVAPO8110PO8510
T = 38℃3.483.4258ThicknessASTM F2251mm0.4 - 0.80.4 - 0.8
T = 60℃11.511.4>DensityASTM D792g/cm³0.870.87



Product Value Proposition

Customized Measurement Solutions